The DA-200 Contour Probe is a portable, self-contained instrument designed to produce a magnetic field on or within ferrous-magnetic materials. The selective AC and DC functions are built into a single reliable instrument.
The AC mode produces an intense AC field for detection of surface defects and demagnetizing after inspection. The DC mode produces an intense Half Wave Rectified DC field for detection of some sub-surface defects. Combined with the flexibility of articulating legs and a rugged molded housing, the Contour Probe can be used on nearly any part or surface contour… in the lab, factory, or field site.